Per: Cassio Barbosa (Instituto Nacional de tecnologia (INT)), alan menezes do nascimento (Insituto Nacional de Tecnologia (INT)), claudio teodoro dos santos (Insituto Nacional de Tecnologia)
Abstract:
EBSD analysis enables the obtention of several crystallographic data, which allow the mapping of phases with different crystalline structures, even with very similar chemical composition, preferential crystallographic textures / orientations, grain size, sub-grains and local disorientations in micro regions, among other data . It allows obtaining, on a micrometric scale, data which are obtained with X-ray diffraction on a macrometric scale. The incidence of the diffracted beam of electrons scattered on a phosphor screen produces in it the so-called Kikuchi bands, which, when indexed by computational methods, generate the patterns that originate the so-called maps, which allow the disclosure of crystallographic information. The computational development of the last decades (hardware and software) has accelerated the processes of obtaining, calibrating and indexing the standards used in the crystallographic analysis of crystalline materials, carried out using electron back scattered diffraction (EBSD: Electron Back Scatter Diffraction), from the incidence of a beam of primary electrons, generated in a scanning electron microscope (SEM). The objective of this work is to contribute to expand the dissemination of this technique, presenting some theoretical concepts and some practical results of analyzes carried out, for illustrative purposes.